Slope wave generation circuit and digital-to-analog conversion circuit thereof, fingerprint identification system

ABSTRACT

The present disclosure, related to the technical field of fingerprint identification, discloses a ramp wave generation circuit, a digital-to-analog conversion circuit, and a fingerprint identification system. The ramp wave generation circuit comprises: an integrating circuit, configured to output a ramp wave signal; a signal regulation circuit, comprising a feedback control loop and a transconductance amplifier connected in series, wherein the feedback control loop monitors the ramp wave signal output by the integrating circuit, and outputs a regulation control signal to the transconductance amplifier, the transconductance amplifier corrects, according to the regulation control signal, a ramp wave signal output by the integrating circuit within a next period; and a voltage generation circuit, configured to respectively output a reference voltage signal to the integrating circuit and the signal regulation circuit.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation of International Patent ApplicationNo. PCT/CN2014/095016, with an international filing date of Dec. 25,2014, designating the United States, now pending, which is based onChinese Patent Application No. 201410579984.3, filed Oct. 24, 2014. Thecontents of these specifications are incorporated herein by reference.

BACKGROUND OF THE INVENTION

Field of the Invention

The present disclosure relates to fingerprint identification, and inparticular, to a ramp wave generation circuit, a digital-to-analogconversion circuit, and a fingerprint identification system.

Description of the Related Art

With the advancement of the security technologies, fingerprintidentification gains more and more attractions among people, which isbeing more and more widely used in various fields. A capacitivefingerprint sensing system is typically formed by fingerprint sensingpixel circuits, which act as basic units of the fingerprint sensingsystem. The pixel circuit extracts a capacitance coupling signal of eachpixel point, and then inputs the signal to another part of thefingerprint sensing system for amplification, analog-to-digitalconversion, image splicing and operations alike, to finally extractvalid fingerprint information. In related arts, the pixel array data isread generally in the following three manners: global analog-to-digitalconversion, local analog-to-digital conversion or row-columnanalog-to-digital conversion. In the above three manners, adigital-to-analog conversion circuit always is used. However, in thedigital-to-analog conversion circuit, a ramp wave generation circuit anda clock generator are simply subjected to the influence ofprocess/voltage/temperature (PVT), and thus the performance of thefingerprint identification system deteriorates.

SUMMARY OF THE INVENTION

An aspect of the present disclosure provides a ramp wave generationcircuit, the ramp wave generation includes: an integrating circuit,configured to output a ramp wave signal; a signal regulation circuit,including a feedback control loop and a transconductance amplifier thatare connected in series, wherein the feedback control loop monitors theramp wave signal output by the integrating circuit, and outputs aregulation control signal to the transconductance amplifier such thatthe transconductance amplifier corrects, according to the regulationcontrol signal, a ramp wave signal output by the integrating circuitwithin a next period; and a voltage generation circuit, configured torespectively output a reference voltage signal to the integratingcircuit and the signal regulation circuit.

Another aspect of the present disclosure provides a fingerprintidentification system, includes a digital-to-analog conversion circuit,wherein the digital-to-analog conversion circuit includes a ramp wavegeneration circuit as described above.

Still another aspect of the present disclosure provides adigital-to-analog conversion circuit, which includes: a ramp wavegeneration circuit as described above, a control circuit, a fingerprintsignal/retaining circuit, a comparator, a clock generator and an N-bitcounter; wherein the control circuit is configured to control the rampwave generation circuit and the N-bit counter to simultaneously operate;the ramp wave generation circuit is configured to output a ramp wavesignal to the comparator under control of the control circuit; thefingerprint signal/retaining circuit is configured to output a pixelsensing signal subjected to enhancement processing to the comparator;the comparator is configured to compare the ramp wave signal with thepixel sensing signal, output a signal to the N-bit counter, and reversethe output signal when the ramp wave signal is equal to the pixelsensing signal; and the N-bit counter is configured to start operatingunder control of the control circuit, and latch a counted value when thesignal output by the comparator is subjected to reversal, such that anADC (Analog to Digital Conversion) outputs a codeword signal uponconversion is obtained; and the clock generator is configured to providetiming reference to the digital-to-analog conversion circuit.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic diagram of a ramp wave generation circuitaccording to an embodiment of the present disclosure;

FIG. 2 is a schematic diagram illustrating an automatictracking-correction mechanism within a duration at a plurality of rampwave generation stages of the ramp wave generation circuit shown in FIG.1;

FIG. 3 is a diagram illustrating principles of a single-slope ramp ADC;

FIG. 4 is a schematic diagram illustrating a ramp wave generationcircuit when a feedback control loop in FIG. 1 is formed by an erroramplifier;

FIG. 5 is a schematic diagram of a ramp wave generation circuitaccording to another embodiment of the present disclosure; and

FIG. 6 is a schematic diagram of a digital-to-analog conversion circuitaccording to an embodiment of the present disclosure.

DETAILED DESCRIPTION OF THE EMBODIMENTS

To make the technical problem to be solved, technical solutions, andadvantages of the present disclosure clearer and more understandable,the present disclosure is further described in detail with reference tothe accompanying drawings and specific embodiments. It should beunderstood that the embodiments described here are only exemplary onesfor illustrating the present disclosure, and are not intended to limitthe present disclosure.

The present disclosure provides a ramp wave generation circuit.Referring to FIG. 1, a ramp wave signal generated by the ramp wavegeneration circuit is a single-slope ramp wave signal, and the ramp wavegeneration circuit includes an integrating circuit 100, a signalregulation circuit 200 and a voltage generation circuit.

The integrating circuit 100 is configured to output a ramp wave signal.The integrating circuit 100 includes a first bilateral switch 110, asecond bilateral switch 121, a third bilateral switch 130, a ramp wavesignal generation capacitor 140 and a first high-gain operationalamplifier 150. The first bilateral switch 110 is connected between anegative input and an output of the first high-gain operationalamplifier 150. One terminal of the ramp wave signal generation capacitor140 is connected to the negative input of the first high-gainoperational amplifier 150, and the other terminal of the ramp wavesignal generation circuit 140 is connected to the output of the firsthigh-gain operational amplifier 150 via the second bilateral switch 120.One terminal of the third bilateral switch 130 is connected to thevoltage generation circuit 300, and the other terminal of the thirdbilateral switch 130 is connected between the ramp wave signalgeneration capacitor 140 and the second bilateral switch 120. It shouldbe noted that in the integrating circuit, the first bilateral switch110, the second bilateral switch 120 and the third bilateral switch 130are respectively controlled by two paths of phase-inversed andnon-overlapped periodic signals, in other words, these three bilateralswitches would not simultaneously operate in a conduction state.

The signal regulation circuit 200 can be formed by a feedback controlloop 210 and a transconductance 220 that are connected in series. Thefeedback control loop 210 monitors the ramp wave signal output by theintegrating circuit 100, and outputs a regulation control signal to thetransconductance amplifier 220 such that the transconductance amplifier220 corrects, according to the regulation control signal, a ramp wavesignal output by the integrating circuit 100 within a next period.

The voltage generation circuit is configured to respectively output areference voltage signal to the integrating circuit and the signalregulation circuit.

The ramp wave generation circuit follows the following workingprinciples:

When the ramp wave generation circuit operates at an initial state, theramp wave signal generation capacitor 140 has no charge. An outputsignal 301 of the voltage generation circuit 300 is marked as V_(SET)_(_) _(STOP), an output signal 302 of the voltage generation circuit 300is marked as V_(SET) _(_) _(VCM), and an output signal 303 of thevoltage generation circuit 300 is marked as V_(SET) _(_) _(START)obviously, each time an output ramp wave signal 101 starts risinglinearly from voltage V_(SET) _(_) _(START).

Firstly, to clarify the key point of analysis, the operation of the rampwave generation circuit without consideration of the impact caused byPVT is as follows:

At the normal operating stage of the ramp wave generation circuit, thefeedback control loop 210 monitors a difference between an “end value”,that is, a voltage V_(RAMP) _(_) _(END) at a highest point of thegenerated ramp wave signal, of the ramp wave signal 101 output by theintegrating circuit 100 and the output signal 301, i.e., V_(SET) _(_)_(STOP), of the voltage generation circuit 300, and outputs a regulationcontrol signal 201 to the transconductance amplifier 220, so as tocorrect a charge current to the ramp wave signal generation capacitor140 which generates a ramp wave signal in a next period. By virtual ofsuch an automatic tracking-correction mechanism, upon several outputperiods of the ramp wave signals, the following relationship should besatisfied:V _(RAMP) _(_) _(END) =V _(SET) _(_) _(STOP)  (2)

Hereinafter the automatic tracking-correction mechanism may be describedin detail by taking the process of generating a ramp wave signal 101 asan example.

During transmission of the ramp wave signal 101, the bilateral switch120 is in a conduction state, whereas the bilateral switches 110 and 130are in a cut-off state. The transconductance amplifier 220 constantlyoutputs a stable charging current under control of the regulationcontrol signal 201 output by the feedback control loop 210, such thatthe voltage at two ends of the ramp wave signal generation capacitor 140rises. Assuming that upon the “tracking-correction” process within aprevious period, a variation of the current output by thetransconductance amplifier 220 is ΔI, then the following equation isestablished:ΔI=g _(m) *ΔV _(error)  (3)

In the equation (3), gin represents a transconductance of thetransconductance amplifier 220, ΔV_(error) represents, when the previousramp wave output stage ends, a difference between V_(RAMP) _(_) _(END)and a predetermined value V_(SET) _(_) _(STOP).

In addition, it is assumed that the capacitance of the ramp wave signalgeneration capacitor 140 is C_(R) and the duration of the ramp wavegeneration stage is T_(RAMP), then:

$\begin{matrix}{{V_{{RAMP}\_{END}} - V_{{SET}\_{START}}} = {I*\frac{T_{RAMP}}{C_{R}}}} & (4)\end{matrix}$

When the ramp wave generation stage within this period ends, if thedifference between V_(RAMP) _(_) _(END) and the predetermined valueV_(SET) _(_) _(STOP) is not 0, that is, the equation (2) is notestablished, in the equation (3) ΔV_(error)≠0, that is, ΔI≠0. Therefore,at the ramp wave output stage within a next period, the followingequation is established

$\begin{matrix}{{V_{{RAMP}\_{END}} - V_{{SET}\_{START}}} = \left( {\left( {I + {\Delta\; I}} \right)*\frac{T_{RAMP}}{C_{R}}} \right)} & (5)\end{matrix}$

Upon several contiguous periods, if ΔV_(error) is sufficiently small,the equation (2) may be established, that is, the ramp wave generationcircuit in FIG. 1 may output a ramp wave signal having a precise andstable amplitude.

Based on the above analysis, the impacts caused by the changes of PVTonto the performance of the ramp wave generation circuit are analyzed.For brevity, each time, the impacts caused by the changes of PVT to onesingle aspect are considered.

1) Changes of PVT cause changes of the output current I of thetransconductance amplifier 317.

According to the equation (4), when the changes of PVT cause the outputcurrent I of the transconductance amplifier 220 to become greater, sincethe capacitance C_(R) of the ramp wave signal generation capacitor 140and the duration T_(RAMP) of the ramp wave generation stage are notchanged, then ΔV_(error)=V_(RAMP) _(_) _(END)−V_(SET) _(_) _(STOP) willbecome greater, that is, it is probable that V_(RAMP) _(_)_(END)>V_(SET) _(_) _(STOP).

According to the equation (3), under effect of a negative feedbackmechanism, the feedback control loop 210 may reduce the output currentof the transconductance amplifier 220, such that when the next periodends ΔV_(error) is reduced. It may be foreseen that upon severalcontiguous periods, the equation (2) would be definitely established.

2) Changes of PVT cause changes of the capacitance C_(R) of thecapacitor 310.

According to the equation (4), when the changes of PVT cause thecapacitance C_(R) of the ramp wave signal generation capacitor 140 tobecome greater, since the output current I of the transconductanceamplifier 220 and the duration T_(RAMP) of the ramp wave generationstage are not changed, then ΔV_(error)=V_(RAMP) _(_) _(END)−V_(SET) _(_)_(STOP) will become greater, that is, it is probable that V_(RAMP) _(_)_(END)<V_(SET) _(_) _(STOP).

According to the equation (3), under effect of the negative feedbackmechanism, the feedback control loop 210 may increase the output currentof the transconductance amplifier 220, such that when the next periodends ΔV_(error) is reduced. It may be foreseen that upon severalcontiguous periods, the equation (2) would be definitely established.

3) Changes of PVT cause changes of the system clock frequency F_(CLK).

According to the equation (4), when the changes of PVT cause the systemclock frequency F_(CLK) to become greater, the duration of the ramp wavegeneration stage T_(RAMP)=N*T_(CLK) is reduced; since the capacitanceC_(R) of the ramp wave signal generation capacitor 140 and the outputcurrent I of the transconductance amplifier 220 are not changed, thenΔV_(error)=V_(RAMP) _(_) _(END)−V_(SET) _(_) _(STOP) will becomesmaller, that is, it is probable that V_(RAMP) _(_) _(END)<V_(SET) _(_)_(STOP).

According to the equation (3), under effect of the negative feedbackmechanism, the feedback control loop 210 may increase the output currentof the transconductance amplifier 220, such that when the next periodends, ΔV_(error) is reduced. It may be foreseen that upon severalcontiguous periods, the equation (2) would be definitely established.

As seen from the analysis on the impacts caused by the changes of PVT tovarious aspects, when the changes of PVT cause a fluctuation of thecircuit parameters, the ramp wave generation circuit in FIG. 1constantly outputs a ramp wave signal having a stable and preciseamplitude, that is, the amplitude ΔV_(RAMP) of generated ramp wavesignal is irrelevant to the changes of PVT.

Still referring to FIG. 2, a schematic diagram illustrates an automatictracking-correction mechanism within a plurality of ramp wave generationstages when the ramp wave generation circuit according to thisembodiment is applied to the single-slope ramp ADC circuit (the rampwave digital-to-analog conversion circuit) of the fingerprintidentification system.

In FIG. 2, ΔV_(error)=V_(RAMP) _(_) _(END)−V_(SET) _(_) _(STOP); andΔV_(RAMP)=V_(RAMP) _(_) _(END)−V_(SET) _(_) _(START) represents avoltage amplitude of the output ramp wave signal 101; andT_(RAMP)=N*T_(CLK), wherein T_(CLK) represents the duration of eachperiod of the system clock generator.

Therefore, the equation (4) may be rewritten as follows:

$\begin{matrix}{{\Delta\; V_{RAMP}} = {{V_{{RAMP}\_{END}} - V_{{SET}\_{START}}} = {I*\frac{N*T_{CLK}}{C_{R}}}}} & \left( {4a} \right)\end{matrix}$

Referring to FIG. 3, it may be known according to the diagram of thesingle-slope ADC that:

$\begin{matrix}{{slope}_{RAMP} = {\frac{\Delta\; V_{RAMP}}{N*T_{CLK}} = \frac{V_{SIG}}{D_{SIG}*T_{CLK}}}} & (5)\end{matrix}$

V_(SIG) represents an analog voltage input to the single-slope ramp ADCcircuit, and D_(SIG)D_(SIG) represents a corresponding quantized outputcodeword.

As seen from the equation (5), for the analog voltage input to thesingle-slope ramp ADC circuit, the corresponding quantized outputcodeword should be:

$\begin{matrix}{D_{SIG} = {\frac{V_{SIG}/T_{CLK}}{{slope}_{RAMP}} = {\frac{V_{SIG}}{\frac{\Delta\; V_{RAMP}}{N}} = {\frac{V_{SIG}}{\Delta\; V_{RAMP}}*N}}}} & (6)\end{matrix}$

When the changes of PVT cause the fluctuation of the circuit parameters,the circuit in FIG. 1 constantly outputs a ramp wave signal having astable and precise amplitude, that is, the amplitude ΔV_(RAMP) of thegenerated ramp wave signal is irrelevant to the changes of PVT. Inaddition, in combination with the equation (6), the performance of thesingle-slope ramp ADC using the ramp wave generation circuit in FIG. 1is also irrelevant to the changes of PVT.

It should be noted that, in practical applications, the feedback controlloop 210 of the signal regulation circuit 200 may be formed by a singleerror amplifier 211. Referring to FIG. 4, a positive input of the erroramplifier 211 is connected to a ramp wave signal output of theintegrating circuit, and a negative input of the error amplifier 211 isconnected to the voltage generation circuit, and an output of the erroramplifier 211 is connected to the transconductance amplifier.

According to the ramp wave generation circuit provided by thisembodiment, the signal regulation circuit is arranged, a ramp wavesignal generated by the integrating circuit is monitored by using thefeedback control loop in the signal regulation circuit, and then aregulation control signal is output to the transconductance amplifier tocorrect a ramp wave signal output by the integrating circuit within anext period. Therefore, a voltage at the highest point of the outputramp wave signal can be automatically regulated, such that the amplitudeof the output ramp wave signal is irrelevant to the changes of PVT,thereby eliminating the impacts caused by PVT. In addition, the circuitis simply practiced, which imposes no requirement on the material of thecapacitor, and thus reduces the manufacture cost. Further, when thecircuit is applied to the fingerprint identification system, the circuitis capable of self-adapting to the changes of the clock frequency of thesystem. When the clock frequency changes, the change of the slope of theramp wave signal causes no impact on such performance indicators assingle-slope ramp ADC gain error, resolution, integral non-linearity(INL) and differential non-linearity (DNL) and the like.

Based on the above embodiments, the following embodiment providesanother ramp wave generation circuit. Referring to FIG. 5, the ramp wavegeneration circuit includes an integrating circuit 100, a signalregulation circuit 200 and a voltage generation circuit.

The integrating circuit 100 is configured to output a ramp wave signal.The integrating circuit 100 includes a first bilateral switch 110, asecond bilateral switch 121, a third bilateral switch 130, a ramp wavesignal generation capacitor 140 and a first high-gain operationalamplifier 150. The first bilateral switch 110 is connected between anegative input and an output of the first high-gain operationalamplifier 150. One terminal of the ramp wave signal generation capacitor140 is connected to the negative input of the first high-gainoperational amplifier 150, and the other terminal of the ramp wavesignal generation capacitor 140 is connected to the output of the firsthigh-gain operational amplifier 150 via the second bilateral switch 120.A first terminal 131 of the third bilateral switch 130 is connected to afirst connection terminal 351 of a third matching resistor 350 of avoltage generation circuit 300, and the other connection terminal of thethird bilateral switch 130 is connected between the ramp wave signalgeneration capacitor 140 and the second bilateral switch 120. It shouldbe noted that in the integrating circuit, the first bilateral switch110, the second bilateral switch 120 and the third bilateral switch 130are respectively controlled by two paths of phase-inversed andnon-overlapped periodic signals, that is, these three bilateral switchescould not simultaneously in a conduction state.

The signal regulation circuit is formed by a feedback control loop 210and a transconductance 220 that are connected in series. The feedbackcontrol loop 210 monitors the ramp wave signal output by the integratingcircuit 100, and outputs a regulation control signal to thetransconductance amplifier 220 such that the transconductance amplifier220 corrects, according to the regulation control signal, a ramp wavesignal output by the integrating circuit 100 within a next period. Thetransconductance amplifier 220 includes an error retaining capacitor 221and an NMOS transistor 222. A gate of the NMOS transistor 222 isconnected to an output of the feedback control loop 210, and one of theremaining two terminals is connected to the ground and the other one isconnected to the negative input of the first high-gain operationalamplifier 150 of the integrating circuit 100 to provide an errorcorrection current for the integrating circuit 100. An error correctioncurrent provided by the NMOS transistor 222 is determined by thefeedback control circuit 210.

The voltage generation circuit 300 is configured to respectively outputa reference voltage signal to the integrating circuit and the signalregulation circuit. The voltage generation circuit 300 includes a secondhigh-gain operational amplifier 310, a current mirror circuit 320, afirst matching resistor 330, a second matching resistor 340 and a thirdmatching resistor 350.

The current mirror circuit 320 is formed by two PMOS transistors thatare connected in a current mirror manner; wherein a first connectionterminal 321 of the current mirror circuit 320 is connected to an outputof the second high-gain operational amplifier 310, a first connectionterminal 331 of the first matching resistor 330 is connected to apositive input of the first high-gain operational amplifier 150 of theintegrating circuit 100, and a second connection terminal 322 of thefirst matching resistor 330 is connected to a first connection terminal341 of the second matching resistor 340 and a voltage input terminal ofthe signal regulation circuit 210; a first connection terminal 351 ofthe third matching resistor 350 is connected to a second connectionterminal 342 of the second matching resistor and a first connectionterminal 131 of the third bilateral switch 130 of the integratingcircuit 100, and a second connection terminal 352 of the third matchingresistor 350 is connected to a second connection terminal 332 of thefirst matching resistor 330 and is grounded; and a negative input of thesecond high-gain operational amplifier 310 is connected to an output ofthe second high-gain operational amplifier 310.

The principles for eliminating the impacts caused by PVT in the rampwave generation circuit according to this embodiment are the same asthose described in the above embodiments, which are thus not describedherein any further.

According to this embodiment, the signal regulation circuit is arrangedin the ramp circuit generation circuit, a ramp wave signal generated bythe integrating circuit is monitored by using the feedback control loopin the signal regulation circuit, and then a regulation control signalis output to the transconductance amplifier to correct a ramp wavesignal output by the integrating circuit within a next period.Therefore, a voltage at the highest point of the output ramp wave signalis automatically regulated, such that the amplitude of the output rampwave signal is irrelevant to the changes of PVT, thereby eliminating theimpacts caused by PVT. In addition, three matching resistors arearranged in the voltage generation circuit, and when the proportion ofthe matching resistors is changed, the amplitude of a reference voltagemay be flexibly changed in a great range.

Based on the above two embodiments, the present disclosure furtherprovides a fingerprint identification system, wherein the systemincludes a digital-to-analog conversion circuit, configured to perform adigital-to-analog conversion for the signal acquired by a fingerprintsensing pixel circuit. Referring to FIG. 6, the digital-to-analogconversion circuit includes:

a control circuit 601, configured to control a ramp wave generationcircuit 602 and an N-bit counter to start to operate simultaneously;

a ramp wave generation circuit 602, configured to output a ramp wavesignal to a comparator 604 under control of the control circuit 601,wherein the ramp wave generation circuit 602 may employ any one of thosedescribed in the above embodiments;

a fingerprint signal/retaining circuit 605, configured to output a pixelsensing signal subjected to enhancement processing to the comparator604;

the comparator 604, configured to compare the ramp wave signal with thepixel sensing signal, output a signal to the N-bit counter 603, andreverse the output signal when the ramp wave signal is equal to thepixel sensing signal; and

the N-bit counter 603, configured to start operating under control ofthe control circuit 601, and latch a counted value when the signaloutput by the comparator 604 is reversed, such that an ADC outputcodeword signal ADC_OUT<N:1> upon conversion is obtained;

a clock generator 606, configured to provide a timing reference for thedigital-to-analog conversion circuit.

In the fingerprint identification system according to this embodiment,the signal regulation circuit is arranged in the ramp circuit generationcircuit, a ramp wave signal generated by the integrating circuit ismonitored by using the feedback control loop in the signal regulationcircuit, and then a regulation control signal is output to thetransconductance amplifier to correct a ramp wave signal output by theintegrating circuit within a next period. Therefore, stability of theramp wave signal generated by the integrating circuit is ensured, andthe impacts caused by PVT are eliminated.

The preferred embodiments of the present disclosure are described withreference to the accompanying drawings, but the scope of the presentdisclosure is not limited to such embodiments. Any modification,equivalent replacement and improvement made by a person skilled in theart without departing from the scope and essence of the presentdisclosure shall all fall within the scope defined by the claims of thepresent disclosure.

INDUSTRIAL PRACTICABILITY

In the ramp wave generation circuit and the digital-to-analog conversioncircuit thereof, and the fingerprint identification system according tothe present disclosure, the signal regulation circuit is arranged in theramp circuit generation circuit, and a ramp wave signal generated by theintegrating circuit is monitored by using the feedback control loop inthe signal regulation circuit, and then a regulation control signal isoutput to the transconductance amplifier tcorrect a ramp wave signaloutput by the integrating circuit within a next period. Therefore, avoltage at the highest point of the output ramp wave signal isautomatically regulated, such that the amplitude of the output ramp wavesignal is irrelevant to the changes of PVT, thereby eliminating theimpacts caused by PVT. In addition, the circuit is simply practiced,which imposes no requirement on the material of the capacitor, and thusreduces the manufacture cost. Further, when the circuit is applied tothe fingerprint identification system, the circuit is capable ofself-adapting to the changes of the clock frequency of the system. Whenthe clock frequency changes, the change of the slope of the ramp wavesignal causes no impact on such performance indicators as single-sloperamp ADC gain error, resolution, integral non-linearity (INL) anddifferential non-linearity (DNL) and the like.

What is claimed is:
 1. A ramp wave generation circuit, comprising: anintegrating circuit, configured to output a ramp wave signal; a signalregulation circuit, comprising a feedback control loop and atransconductance amplifier connected in series, wherein the feedbackcontrol loop is configured to monitor the ramp wave signal, and output aregulation control signal to the transconductance amplifier, and thetransconductance amplifier is configured to correct, according to theregulation control signal, a ramp wave signal output by the integratingcircuit within a next period; and a voltage generation circuit,configured to respectively output a reference voltage signal to theintegrating circuit and the signal regulation circuit; wherein thefeedback control loop comprises an error amplifier, wherein a positiveinput of the error amplifier is connected to a ramp wave signal outputof the integrating circuit, a negative input of the error amplifier isconnected to the voltage generation circuit, and an output of the erroramplifier is connected to the transconductance amplifier.
 2. The rampwave generation circuit according to claim 1, wherein the integratingcircuit comprises a first bilateral switch, a second bilateral switch, athird bilateral switch, a ramp wave signal generation capacitor and afirst high-gain operational amplifier; wherein the first bilateralswitch is connected between a negative input and an output of the firsthigh-gain operational amplifier; one terminal of the ramp wave signalgeneration capacitor is connected to the negative input of the firsthigh-gain operational amplifier, and the other terminal of the ramp wavesignal generation circuit is connected to the output of the firsthigh-gain operational amplifier via the second bilateral switch; and oneterminal of the third bilateral switch is connected to the voltagegeneration circuit, and the other terminal of the third bilateral switchis connected between the ramp wave signal generation capacitor and thesecond bilateral switch.
 3. The ramp wave generation circuit accordingto claim 2, wherein the first bilateral switch, the second bilateralswitch and the third bilateral switch are respectively controlled by twopaths of phase-reverse and non-overlapped periodic signals.
 4. The rampwave generation circuit according to claim 2, wherein thetransconductance amplifier comprises an error retaining capacitor and anNMOS transistor, wherein a gate of the NMOS transistor is connected toan output of the feedback control loop, one of the remaining twoterminals of the NMOS transistor is connected to the ground, and theother of the remaining two terminals is connected to the negative inputof the first high-gain operational amplifier of the integrating circuitto provide an error correction current for the integrating circuit. 5.The ramp wave generation circuit according to claim 1, wherein thevoltage generation circuit comprises a second high-gain operationalamplifier, a current mirror circuit, a first matching resistor, a secondmatching resistor and a third matching resistor; wherein the currentmirror circuit is formed by two PMOS transistors that are connected in acurrent mirror manner, wherein a first connection terminal of thecurrent mirror circuit is connected to an output of the second high-gainoperational amplifier, a first connection terminal of the first matchingresistor is connected to a positive input of the first high-gainoperational amplifier of the integrating circuit, and a secondconnection terminal of the first matching resistor is connected to afirst connection terminal of the second matching resistor and a voltageinput terminal of the signal regulation circuit; a first connectionterminal of the third matching resistor is connected to a secondconnection terminal of the second matching resistor and a firstconnection terminal of the third bilateral switch of the integratingcircuit, and a second connection terminal of the third matching resistoris connected to a second connection terminal of the first matchingresistor and is grounded; and a negative input of the second high-gainoperational amplifier is connected to an output of the second high-gainoperational amplifier.
 6. A fingerprint identification system,comprising a digital-to-analog conversion circuit, wherein thedigital-to-analog conversion circuit comprises a ramp wave generationcircuit, and the ramp wave generation circuit comprises: an integratingcircuit, configured to output a ramp wave signal; a signal regulationcircuit, comprising a feedback control loop and a transconductanceamplifier connected in series, wherein the feedback control loop isconfigured to monitor the ramp wave signal output by the integratingcircuit, and output a regulation control signal to the transconductanceamplifier; the transconductance amplifier is configured to correct,according to the regulation control signal, a ramp wave signal output bythe integrating circuit within a next period; and a voltage generationcircuit, configured to respectively output a reference voltage signal tothe integrating circuit and the signal regulation circuit; wherein thefeedback control loop comprises an error amplifier, wherein a positiveinput of the error amplifier is connected to a ramp wave signal outputof the integrating circuit, a negative input of the error amplifier isconnected to the voltage generation circuit, and an output of the erroramplifier is connected to the transconductance amplifier.
 7. Thefingerprint identification system according to claim 6, wherein theintegrating circuit comprises a first bilateral switch, a secondbilateral switch, a third bilateral switch, a ramp wave signalgeneration capacitor and a first high-gain operational amplifier;wherein the first bilateral switch is connected between a negative inputand an output of the first high-gain operational amplifier; one terminalof the ramp wave signal generation capacitor is connected to thenegative input of the first high-gain operational amplifier, and theother terminal of the ramp wave signal generation circuit is connectedto the output of the first high-gain operational amplifier via thesecond bilateral switch; and one terminal of the third bilateral switchis connected to the voltage generation circuit, and the other terminalof the third bilateral switch is connected between the ramp wave signalgeneration capacitor and the second bilateral switch.
 8. The fingerprintidentification system according to claim 7, wherein the first bilateralswitch, the second bilateral switch and the third bilateral switch arerespectively controlled by two paths of phase-reverse and non-overlappedperiodic signals.
 9. The fingerprint identification system according toclaim 7, wherein the transconductance amplifier comprises an errorretaining capacitor and an NMOS transistor, wherein a gate of the NMOStransistor is connected to an output of the feedback control loop, oneof the remaining two terminals of the NMOS transistor is connected tothe ground, and the other of the remaining two terminals is connected tothe negative input of the first high-gain operational amplifier of theintegrating circuit to provide an error correction current for theintegrating circuit.
 10. The fingerprint system according to claim 6,wherein the voltage generation circuit comprises a second high-gainoperational amplifier, a current mirror circuit, a first matchingresistor, a second matching resistor and a third matching resistor;wherein the current mirror circuit is formed by two PMOS transistorsthat are connected in a current mirror manner, wherein a firstconnection terminal of the current mirror circuit is connected to anoutput of the second high-gain operational amplifier, a first connectionterminal of the first matching resistor is connected to a positive inputof the first high-gain operational amplifier of the integrating circuit,and a second connection terminal of the first matching resistor isconnected to a first connection terminal of the second matching resistorand a voltage input terminal of the signal regulation circuit; a firstconnection terminal of the third matching resistor is connected to asecond connection terminal of the second matching resistor and a firstconnection terminal of the third bilateral switch of the integratingcircuit, and a second connection terminal of the third matching resistoris connected to a second connection terminal of the first matchingresistor and is grounded; and a negative input of the second high-gainoperational amplifier is connected to an output of the second high-gainoperational amplifier.
 11. An analog-to-digital conversion circuit,comprising: a ramp wave generation circuit, a control circuit, afingerprint signal/retaining circuit, a comparator, a clock generatorand an N-bit counter; wherein the control circuit is configured tocontrol the ramp wave generation circuit and the N-bit counter tosimultaneously operate; the ramp wave generation circuit is configuredto output a ramp wave signal to the comparator under control of thecontrol circuit; the fingerprint signal/retaining circuit is configuredto output a pixel sensing signal after enhancement processing to thecomparator; the comparator is configured to compare the ramp wave signalwith the pixel sensing signal, output a signal to the N-bit counter, andreverse the output signal when the ramp wave signal is equal to thepixel sensing signal; the N-bit counter is configured to start operatingunder control of the control circuit, and latch a counted value when thesignal output by the comparator is subjected to reversal, such that anADC output codeword signal upon conversion is obtained; and the clockgenerator is configured to provide a timing reference for thedigital-to-analog conversion circuit; wherein the feedback control loopcomprises an error amplifier, wherein a positive input of the erroramplifier is connected to a ramp wave signal output of the integratingcircuit, a negative input of the error amplifier is connected to thevoltage generation circuit, and an output of the error amplifier isconnected to the transconductance amplifier.
 12. The analog-to-digitalconversion circuit according to claim 11, wherein the ramp wavegeneration circuit comprises: an integrating circuit, configured tooutput a ramp wave signal; a signal regulation circuit, comprising afeedback control loop and a transconductance amplifier connected inseries, wherein the feedback control loop is configured to monitor theramp wave signal output by the integrating circuit, and output aregulation control signal to the transconductance amplifier; thetransconductance amplifier is configured to correct, according to theregulation control signal, a ramp wave signal output by the integratingcircuit within a next period; and a voltage generation circuit,configured to respectively output a reference voltage signal to theintegrating circuit and the signal regulation circuit.